Combined Test Data Compression and Abort-on-Fail Test
Författare
Summary, in English
Publiceringsår
2006
Språk
Engelska
Sidor
137-140
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- testing
- test data
- compression
- abort-on-fail
Conference name
NORCHIP Conference, 2006
Conference date
2006-11-20 - 2006-11-21
Conference place
Linköping, Sweden
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 1-4244-0772-9