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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Författare:
Publiceringsår: 2010
Språk: Engelska
Sidor:
Publikation/Tidskrift/Serie: New Journal of Physics
Volym: 12
Dokumenttyp: Artikel
Förlag: IOP Publishing Ltd

Sammanfattning

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

Disputation

Nyckelord

  • Physics and Astronomy

Övriga

Published
Yes
  • Nano
  • ISSN: 1367-2630

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