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Electron microscopy based studies of catalytically grown semiconductor nanowires

In English

Författare

Redaktör

  • Giancarlo Salviati
  • T Sekiguchi
  • S Heun
  • Anders Gustafsson

Summary, in English

We give an introduction to modern electron microscopy techniques, applied to semiconductor structures. We concentrate on the analytical capabilities of high resolution transmission electron microscopy (TEM) and luminescence-based analysis, cathodoluminescence, in the scanning electron microscope. For the TEM, we will demonstrate a number of techniques and detection schemes, such as energy dispersive analysis of X-rays, electron energy loss spectroscopy, high-angle annular darkfield, and Fourier and strain mapping. The capabilities of the techniques are illustrated by various semiconductor nanowires (NWs), grown catalytically by gold seed-particles on planar substrates. These structures include homogeneous NWs, heterostructured NWs, core-shell NWs and branched NWs.

Publiceringsår

2008

Språk

Engelska

Sidor

1-35

Publikation/Tidskrift/Serie

Beam Injection Based Nanocharacterization of Advanced Materials

Dokumenttyp

Del av eller Kapitel i bok

Förlag

Research Signpost

Ämne

  • Condensed Matter Physics
  • Chemical Sciences

Status

Published

ISBN/ISSN/Övrigt

  • ISBN: 978-81-308-0226-8