Webbläsaren som du använder stöds inte av denna webbplats. Alla versioner av Internet Explorer stöds inte längre, av oss eller Microsoft (läs mer här: * https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Var god och använd en modern webbläsare för att ta del av denna webbplats, som t.ex. nyaste versioner av Edge, Chrome, Firefox eller Safari osv.

X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.

In English

Författare

Summary, in English

The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.

Publiceringsår

2015

Språk

Engelska

Sidor

59-66

Publikation/Tidskrift/Serie

Journal of Synchrotron Radiation

Volym

22

Issue

Pt 1

Dokumenttyp

Artikel i tidskrift

Förlag

International Union of Crystallography

Ämne

  • Accelerator Physics and Instrumentation

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1600-5775