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Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

Författare:
  • M Lundwall
  • Maxim Tchaplyguine
  • G Ohrwall
  • A Lindblad
  • Sergey Peredkov
  • T Rander
  • S Svensson
  • O Bjorneholm
Publiceringsår: 2005
Språk: Engelska
Sidor: 12-19
Publikation/Tidskrift/Serie: SURFACE SCIENCE
Volym: 594
Nummer: 1-3
Dokumenttyp: Artikel
Förlag: ELSEVIER SCIENCE BV

Sammanfattning

The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.

Disputation

Nyckelord

  • Physics and Astronomy
  • photoelectron
  • Auger ejection
  • photoelectron spectroscopy
  • spectroscopy
  • Auger electron
  • surface sensitivity
  • effective attenuation length-
  • synchrotron radiation photoelectron spectroscopy
  • emission

Övriga

Published
Yes
  • ISSN: 0039-6028

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