Meny

Javascript is not activated in your browser. This website needs javascript activated to work properly.
Du är här

Graph Theoretic Approach for Scan Cell Reordering to Minimize Peak Shift Power

Författare:
  • Jaynarayan T. Tudu
  • Erik Larsson
  • Virendra Singh
  • Hideo Fujiwara
Publiceringsår: 2010
Språk: Engelska
Sidor: 73-78
Dokumenttyp: Konferensbidrag

Sammanfattning

Scan circuit testing generally causes excessive switching activity compared to normal circuit operation. This excessive switching activity causes high peak and average power consumption. Higher peak power causes, supply voltage droop and excessive heat dissipation. This paper proposes a scan cell reordering methodology to minimize the peak power consumption during scan shift operation. The proposed methodology first formulate the problem as graph theoretic problem then solve it by a linear time heuristic. The experimental results show that the methodology is able to reduce up to 48% of peak power in compared to the solution provided by industrial tool.

Disputation

Nyckelord

  • Technology and Engineering

Övriga

Great Lakes Symposium on VLSI (GLSVLSI'10)
2014-05-17
Rhode Island, USA,
Published
Yes

Box 117, 221 00 LUND
Telefon 046-222 00 00 (växel)
Telefax 046-222 47 20
lu [at] lu [dot] se

Fakturaadress: Box 188, 221 00 LUND
Organisationsnummer: 202100-3211
Om webbplatsen