An Even-Odd DFD Technique for Scan Chain Diagnosis
Författare
Publiceringsår
2009
Språk
Engelska
Dokumenttyp
Konferensbidrag
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
Workshop on RTL and High Level Testing (WRTLT)
Conference date
2009-11-27 - 2009-11-28
Conference place
Hongkong, China
Status
Published