Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Författare
Summary, in English
Publiceringsår
2005
Språk
Engelska
Sidor
8-13
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- testing
- systems-on-chip
- yield-per-module
- TAM
- test scheduling
Conference name
IEEE European Test Symposium ETS 05, 2005
Conference date
2005-05-22 - 2005-05-25
Conference place
Tallinn, Estonia
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 0-7695-2341-2