An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Författare
Summary, in English
Publiceringsår
2003
Språk
Engelska
Sidor
51-56
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- test application time
- system-on-chip
- SOC
- wrapper
- test access mechanism
- TAM
- P1500 restrictions
- TestBus architecture
- test conflicts
Conference name
IEEE European Test Workshop 2003 ETW03
Conference date
2003-05-25 - 2003-05-28
Conference place
Maastricht, Netherlands
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1530-1877
- ISBN: 0-7695-1908-3