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Characterizing the geometry of InAs nanowires using mirror electron microscopy

Författare:
Publiceringsår: 2012
Språk: Engelska
Sidor:
Publikation/Tidskrift/Serie: Nanotechnology
Volym: 23
Nummer: 12
Dokumenttyp: Artikel
Förlag: IOP Publishing Ltd

Sammanfattning

Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.

Disputation

Nyckelord

  • Physics and Astronomy

Övriga

Published
Yes
  • ISSN: 0957-4484

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