Du är här

Re-using Chip Level DFT at Board Level

Författare:
  • Xinli Gu
  • Jeff Rearick
  • Bill Eklow
  • Jun Qian
  • Artur Jutman
  • Krishnendu Chakrabarty
  • Erik Larsson
Publiceringsår: 2012
Språk: Engelska
Sidor: 205-205
Dokumenttyp: Konferensbidrag
Förlag: IEEE Computer Society

Sammanfattning

As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?

Disputation

Nyckelord

  • Technology and Engineering
  • Board test
  • board diagnosis
  • chip access
  • IEEE P1687
  • IEEE 1149.1

Övriga

European Test Symposium
2012-05-28
Annecy, France
Published
Yes
  • Digital ASIC

Box 117, 221 00 LUND
Telefon 046-222 00 00 (växel)
Telefax 046-222 47 20
lu [at] lu [dot] se

 

Fakturaadress: Box 188, 221 00 LUND
Organisationsnummer: 202100-3211
Om webbplatsen