Publikationer
Re-using Chip Level DFT at Board Level
Avdelning/ar:
Publiceringsår: 2012
Språk: Engelska
Sidor: 205-205
Fulltext:
Dokumenttyp: Konferensbidrag
Förlag: IEEE Computer Society
Sammanfattning
As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?
Disputation
Nyckelord
- Technology and Engineering
- Board test
- board diagnosis
- chip access
- IEEE P1687
- IEEE 1149.1
Övrigt
European Test Symposium
2012-05-28
Annecy, France
Published
Yes
- Digital ASIC

