Re-using Chip Level DFT at Board Level
Författare
Summary, in English
Publiceringsår
2012
Språk
Engelska
Sidor
205-205
Publikation/Tidskrift/Serie
[Host publication title missing]
Fulltext
- Available as PDF - 94 kB
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Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- Board test
- board diagnosis
- chip access
- IEEE P1687
- IEEE 1149.1
Conference name
European Test Symposium, 2012
Conference date
2012-05-28 - 2012-05-28
Conference place
Annecy, France
Status
Published
Forskningsgrupp
- Digital ASIC