Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
Författare
Summary, in English
Publiceringsår
2011
Språk
Engelska
Sidor
525-531
Publikation/Tidskrift/Serie
2011 Asian Test Symposium
Fulltext
- Available as PDF - 234 kB
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Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- Test Scheduling
- Constraints
- IEEE P1687
- IJTAG
Conference name
Test Symposium (ATS), 2011 20th Asian
Conference date
2011-11-20
Conference place
New Delhi, India
Status
Published
Forskningsgrupp
- Digital ASIC
ISBN/ISSN/Övrigt
- ISSN: 1081-7735
- ISBN: 978-1-4577-1984-4