A Methodology for Measurements of Basic Parameters in a xDSL System
Författare
Summary, in English
Publiceringsår
2006
Språk
Engelska
Publikation/Tidskrift/Serie
Proceedings of SPIE, the International Society for Optical Engineering
Volym
6390
Dokumenttyp
Konferensbidrag
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
SPIE Broadband Access Communication Technologies, 2006
Conference date
2006-10-02 - 2006-10-03
Conference place
Boston, MA, United States
Status
Published