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Accessing Embedded DfT Instruments with IEEE P1687

Publiceringsår: 2012
Språk: Engelska
Sidor: 71-76
Dokumenttyp: Konferensbidrag

Sammanfattning

While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.

Disputation

Nyckelord

  • Technology and Engineering
  • IEEE P1687 IJTAG
  • IEEE 1149.1
  • embedded instruments

Övrigt

Asian Test Symposium
2012-11-20
Niigata, Japan
Published
Yes
  • Digital ASIC

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