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In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM

In English

Författare

Summary, in English

A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM

Publiceringsår

2002

Språk

Engelska

Publikation/Tidskrift/Serie

7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science

Dokumenttyp

Konferensbidrag

Förlag

Lund University

Ämne

  • Chemical Sciences

Nyckelord

  • transmission electron microscopy
  • STM
  • scanning tunnelling microscopy
  • III-V nanowhiskers
  • in situ manipulations
  • electrical measurements
  • TEM
  • semiconductor nanowhiskers
  • nano structures
  • InAs/InP nanowhisker
  • InAs-InP

Conference name

Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)

Conference date

2002-06-24 - 2002-06-28

Conference place

Malmö, Sweden

Status

Published