Optimal System-on-Chip Test Scheduling
Författare
Summary, in English
Publiceringsår
2003
Språk
Engelska
Sidor
306-311
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- test scheduling
- test access mechanisms
- TAM
- test conflicts
- test wrappers
- TAM routing
Conference name
12th IEEE Asian Test Symposium ATS03
Conference date
2003-11-16 - 2003-11-19
Conference place
Xi'an, China
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1081-7735
- ISBN: 0-7695-1951-2