Test Time Analysis for IEEE P1687
Författare
Summary, in English
Publiceringsår
2010
Språk
Engelska
Sidor
455-460
Publikation/Tidskrift/Serie
Test Symposium (ATS), 2010 19th IEEE Asian
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
19th IEEE Asian Test Symposium (ATS10)
Conference date
2010-12-01 - 2010-12-04
Conference place
Shanghai, China
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 978-1-4244-8841-4