Compressibility and thermal expansion of cubic silicon nitride
Författare
Summary, in English
The compressibility and thermal expansion of the cubic silicon nitride (c-Si3N4) phase have been investigated by performing in situ x-ray powder-diffraction measurements using synchrotron radiation, complemented with computer simulations by means of first-principles calculations. The bulk compressibility of the c-Si3N4 phase originates from the average of both Si-N tetrahedral and octahedral compressibilities where the octahedral polyhedra are less compressible than the tetrahedral ones. The origin of the unit cell expansion is revealed to be due to the increase of the octahedral Si-N and N-N bond lengths with temperature, while the lengths for the tetrahedral Si-N and N-N bonds remain almost unchanged in the temperature range 295-1075 K.
Avdelning/ar
Publiceringsår
2002-04-15
Språk
Engelska
Sidor
1612021-1612024
Publikation/Tidskrift/Serie
Physical Review B (Condensed Matter)
Volym
65
Issue
16
Dokumenttyp
Artikel i tidskrift
Förlag
American Physical Society
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 0163-1829