Optimized Integration of Test Compression and Sharing for SOC Testing
Författare
Summary, in English
Publiceringsår
2007
Språk
Engelska
Sidor
207-207
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- testing
- system-on-chip
- SOC
- test scheduling
- memory requirements
- test data compression
- constraint logic programming
Conference name
Design, Automation, and Test in Europe Conference DATE07
Conference date
2007-04-16 - 2007-04-20
Conference place
Nice, France
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 978-3-9810801-2-4