Electron microscopy based studies of catalytically grown semiconductor nanowires
Författare
Redaktör
- Giancarlo Salviati
- T Sekiguchi
- S Heun
- Anders Gustafsson
Summary, in English
We give an introduction to modern electron microscopy techniques, applied to semiconductor structures. We concentrate on the analytical capabilities of high resolution transmission electron microscopy (TEM) and luminescence-based analysis, cathodoluminescence, in the scanning electron microscope. For the TEM, we will demonstrate a number of techniques and detection schemes, such as energy dispersive analysis of X-rays, electron energy loss spectroscopy, high-angle annular darkfield, and Fourier and strain mapping. The capabilities of the techniques are illustrated by various semiconductor nanowires (NWs), grown catalytically by gold seed-particles on planar substrates. These structures include homogeneous NWs, heterostructured NWs, core-shell NWs and branched NWs.
Publiceringsår
2008
Språk
Engelska
Sidor
1-35
Publikation/Tidskrift/Serie
Beam Injection Based Nanocharacterization of Advanced Materials
Dokumenttyp
Del av eller Kapitel i bok
Förlag
Research Signpost
Ämne
- Condensed Matter Physics
- Chemical Sciences
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 978-81-308-0226-8