Accessing Embedded DfT Instruments with IEEE P1687
Publikation/Tidskrift/Serie: IEEE 21st Asian Test Symposium (ATS), 2012
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.
- Electrical Engineering, Electronic Engineering, Information Engineering
- IEEE P1687 IJTAG
- IEEE 1149.1
- embedded instruments
IEEE 21st Asian Test Symposium (ATS)
- Digital ASIC-lup-obsolete
- ISSN: 1081-7735
- ISBN: 978-1-4673-4555-2