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Accessing Embedded DfT Instruments with IEEE P1687

Publiceringsår: 2012
Språk: Engelska
Sidor: 71-76
Publikation/Tidskrift/Serie: IEEE 21st Asian Test Symposium (ATS), 2012
Dokumenttyp: Konferensbidrag
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.


While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.


  • Electrical Engineering, Electronic Engineering, Information Engineering
  • IEEE P1687 IJTAG
  • IEEE 1149.1
  • embedded instruments


IEEE 21st Asian Test Symposium (ATS)
  • Digital ASIC-lup-obsolete
  • ISSN: 1081-7735
  • ISBN: 978-1-4673-4555-2

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