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AFM-based manipulation of InAs nanowires

Publiceringsår: 2008
Språk: Engelska
Sidor: 052051-052051
Publikation/Tidskrift/Serie: Journal of Physics: Conference Series
Volym: 100
Dokumenttyp: Konferensbidrag
Förlag: IOP Publishing


A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the 'Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.


  • Condensed Matter Physics


17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology
  • ISSN: 1742-6588
  • ISSN: 1742-6596

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