Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Summary, in English

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

• Författare: V. Favre-Nicolin; F. Mastropietro; J. Eymery; D. Camacho; Y. M. Niquet; Mattias Borg; Maria Messing; Lars-Erik Wernersson; R. E. Algra; E. P. A. M. Bakkers; T. H. Metzger; R. Harder; I. K. Robinson
• Avdelning/ar: Fasta tillståndets fysik; Institutionen för elektro- och informationsteknik; NanoLund: Centre for Nanoscience
• Publiceringsår: 2010
• Språk: Engelska
• Publikation/Tidskrift/Serie: New Journal of Physics
• Volym: 12
• Länkar: http://dx.doi.org/10.1088/1367-2630/12/3/035013
• Dokumenttyp: Artikel i tidskrift
• Förlag: IOP Publishing
• Ämne: Condensed Matter Physics; Electrical Engineering, Electronic Engineering, Information Engineering
• Status: Published
• Forskningsgrupp: Nano
• ISBN/ISSN/Övrigt: ISSN: 1367-2630