Webbläsaren som du använder stöds inte av denna webbplats. Alla versioner av Internet Explorer stöds inte längre, av oss eller Microsoft (läs mer här: * https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Var god och använd en modern webbläsare för att ta del av denna webbplats, som t.ex. nyaste versioner av Edge, Chrome, Firefox eller Safari osv.

Decay of core excitations in bulk h-BN studied with resonant Auger spectroscopy

In English

Författare

Summary, in English

Non-radiative decay of core excitations at the B 1s and N 1s absorption edges of bulk hexagonal boron nitride (h-BN) has been studied with resonant Auger spectroscopy. In order to reproduce the bulk properties of the sample while keeping it electrically conducting, we have grown reasonably thick (more than 20nm) polycrystalline films of h-BN on a Ni(111) surface by thermal cracking of borazine vapor. The probability of the participator Auger process in the non-radiative decay of the B 1s(-1) pi* and N 1s(-1) pi* excitations has been found to be very high (31%) and rather low (below 0.5%), respectively. The drastic difference between the participator Auger decay probabilities of these two excitations has been explained in terms of different localization of the electrons promoted into the lowest unoccupied pi* state on the cationic (B) and anionic (N) sites.

Publiceringsår

2005

Språk

Engelska

Sidor

59-64

Publikation/Tidskrift/Serie

Journal of Electron Spectroscopy and Related Phenomena

Volym

148

Issue

1

Dokumenttyp

Artikel i tidskrift

Förlag

Elsevier

Ämne

  • Physical Sciences
  • Natural Sciences

Nyckelord

  • resonant Auger
  • photoelectron spectroscopy
  • boron nitride
  • NEXAFS
  • spectroscopy

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 0368-2048